Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy

• Patrick Stohmann,
• Sascha Koch,
• Yang Yang,
• Christopher David Kaiser,
• Julian Ehrens,
• Jürgen Schnack,
• Niklas Biere,
• Dario Anselmetti,
• Armin Gölzhäuser and
• Xianghui Zhang

Beilstein J. Nanotechnol. 2022, 13, 462–471, doi:10.3762/bjnano.13.39

• simulations, we propose that these voids may correspond to free volumes inside a cross-linked monolayer. Keywords: carbon nanomembranes; electron-induced cross-linking; scanning tunneling microscopy; self-assembled monolayers; subnanometer pores; Introduction Electron-induced chemistry plays an essential

• create ultrathin carbon nanomembranes (CNMs) [25][26]. Depending on the precursor molecules and the exposure conditions, thickness [27], mechanical stiffness [28], and electronic transport characteristics [29][30] of CNMs can be tailored. Carbon nanomembranes have been applied as electron microscopy

• cross-linked regions appear darker than the structurally ordered domains. At high doses, subnanometer-sized voids are formed preferably in regions of lower structural order and lower density in the monolayer. The formation of carbon nanomembranes was also modeled using classical molecular dynamics

Exploring the fabrication and transfer mechanism of metallic nanostructures on carbon nanomembranes via focused electron beam induced processing

• Christian Preischl,
• Linh Hoang Le,
• Elif Bilgilisoy,
• Armin Gölzhäuser and
• Hubertus Marbach

Beilstein J. Nanotechnol. 2021, 12, 319–329, doi:10.3762/bjnano.12.26

• agent need to be considered and further studied. Keywords: 2D materials; carbon nanomembranes (CNMs); focused electron beam-induced processing; metallic nanostructures; self-assembled monolayers; Introduction Focused electron beam-induced processing (FEBIP) is a powerful maskless “direct-write

• 2D materials used in this approach are ultrathin carbon nanomembranes (CNMs) [21]. CNMs are versatile 2D organic materials with high thermal [22] and mechanical [23] stability that can be produced by electron-induced cross-linking of aromatic self-assembled monolayers (SAMs) [24] and transferred onto

Scanning transmission helium ion microscopy on carbon nanomembranes

• Daniel Emmrich,
• Annalena Wolff,
• Nikolaus Meyerbröker,
• Jörg K. N. Lindner,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18

• energy-filtered transmission electron microscopy measurements. Keywords: carbon nanomembranes; dark field; helium ion microscopy (HIM); scanning transmission ion microscopy (STIM); SRIM simulations; Introduction Throughout the past decade, the helium ion microscope (HIM) has emerged as a versatile

• -field scanning transmission ion microscopy (STIM) holder. The holder design is based on the concept of a SE conversion holder. The holder can easily be implemented into any existing HIM. It is mounted on the sample stage without modifications to the microscope. Carbon nanomembranes (CNMs) serve as test

• for ion microscopes. The dark-field STIM detector enables the imaging of very thin carbon nanomembranes with a high signal-to-noise ratio, which could not be achieved using the conventional ETD detector in the HIM. The evaluation of the contrast mechanism suggests that the detector is suitable for end

Fusion of purple membranes triggered by immobilization on carbon nanomembranes

• René Riedel,
• Natalie Frese,
• Fang Yang,
• Martin Wortmann,
• Raphael Dalpke,
• Daniel Rhinow,
• Norbert Hampp and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 93–101, doi:10.3762/bjnano.12.8

Amplified cross-linking efficiency of self-assembled monolayers through targeted dissociative electron attachment for the production of carbon nanomembranes

• Sascha Koch,
• Christopher D. Kaiser,
• Paul Penner,
• Michael Barclay,
• Lena Frommeyer,
• Daniel Emmrich,
• Patrick Stohmann,
• Tarek Abu-Husein,
• Andreas Terfort,
• D. Howard Fairbrother,
• Oddur Ingólfsson and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2017, 8, 2562–2571, doi:10.3762/bjnano.8.256

• may thus lead to a significantly faster conversion of the respective SAMs into carbon nanomembranes (CNMs) without the need for an increased current density. XPS data support the notation that DEA sensitization may be used to achieve more efficient electron-induced cross-linking of SAMs, revealing

• nanomembrane; dissociative electron attachment; dissociative ionization; helium ion microscopy; self-assembled monolayers; X-ray photoelectron spectroscopy; Introduction Carbon nanomembranes (CNMs) are two-dimensional molecular sheets with a thickness of one to a few nanometers, high mechanical strength, and

• 50 eV. Cross-linking of the molecular layers and the formation of mechanically stable carbon nanomembranes (CNMs) was then monitored through X-ray photoelectron spectroscopy (XPS) during the irradiation process. This enables the transition of the SAMs into CNMs to be observed and allows the

Focused particle beam-induced processing

• Michael Huth and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2015, 6, 1883–1885, doi:10.3762/bjnano.6.191

• polymerization that is a basis for the creation of ultrathin nanomembranes. Finally, André Beyer and coworkers show impressive HIM images of ultrathin carbon nanomembranes [17], which is a clear indication of the potential of the bourgeoning fields of helium ion microscopy and lithography towards nanofabrication

Imaging of carbon nanomembranes with helium ion microscopy

• André Beyer,
• Henning Vieker,
• Robin Klett,
• Hanno Meyer zu Theenhausen,
• Polina Angelova and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2015, 6, 1712–1720, doi:10.3762/bjnano.6.175

• Andre Beyer Henning Vieker Robin Klett Hanno Meyer zu Theenhausen Polina Angelova Armin Golzhauser Physics of Supramolecular Systems and Surfaces, Bielefeld University, 33615 Bielefeld, Germany CNM Technologies GmbH, 33609 Bielefeld, Germany 10.3762/bjnano.6.175 Abstract Carbon nanomembranes

• nanomembrane; helium ion microscopy; self-assembled monolayers; Introduction Carbon nanomembranes (CNMs) are extremely thin and homogeneous two-dimensional objects consisting of a monolayer of laterally cross-linked molecules. They are made by exposing a self-assembled monolayer (SAM) of aromatic molecules

Classical molecular dynamics investigations of biphenyl-based carbon nanomembranes

• Andreas Mrugalla and
• Jürgen Schnack

Beilstein J. Nanotechnol. 2014, 5, 865–871, doi:10.3762/bjnano.5.98

• Andreas Mrugalla Jurgen Schnack Fakultät für Physik, Universität Bielefeld, Postfach 100131, D-33501 Bielefeld, Germany 10.3762/bjnano.5.98 Abstract Background: Free-standing carbon nanomembranes (CNM) with molecular thickness and macroscopic size are fascinating objects both for fundamental

• dynamics investigations of biphenyl-based carbon nanomembranes. We show that one-dimensional graphene-like stripes constitute a highly symmetric quasi one-dimensional energetically favorable ground state. This state does not cross-link. Instead cross-linked structures are formed from highly excited

• : biphenyls; carbon nanomembranes; classical molecular dynamics; Introduction Freestanding carbon nanomembranes are produced from molecular precursors such as biphenylthiols (BPT). The precursors self-assemble in monolayers on gold surfaces and are then polymerized by irradiation with electrons [1][2][3

Fabrication of carbon nanomembranes by helium ion beam lithography

• Xianghui Zhang,
• Henning Vieker,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2014, 5, 188–194, doi:10.3762/bjnano.5.20

• universal method for the fabrication of ultrathin carbon nanomembranes (CNMs). Here we demonstrate the cross-linking of aromatic SAMs due to exposure to helium ions. The distinction of cross-linked from non-cross-linked regions in the SAM was facilitated by transferring the irradiated SAM to a new substrate

• times smaller than the corresponding electron irradiation dose. Most likely, this is due to the energy distribution of secondary electrons shifted to lower energies, which results in a more efficient dissociative electron attachment (DEA) process. Keywords: carbon nanomembranes; dissociative electron

• attachment; helium ion microscopy; ion beam-organic molecules interactions; self-assembled monolayers; Introduction Carbon nanomembranes (CNMs) with monomolecular thickness and macroscopic lateral size represent a new type of functional two-dimensional (2D) materials [1]. A universal scheme to fabricate

Mechanical characterization of carbon nanomembranes from self-assembled monolayers

• Xianghui Zhang,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2011, 2, 826–833, doi:10.3762/bjnano.2.92

• Xianghui Zhang Andre Beyer Armin Golzhauser Department of Physics, Physics of Supramolecular Systems and Surfaces, Bielefeld University, 33615 Bielefeld, Germany 10.3762/bjnano.2.92 Abstract This paper reports on the mechanical characterization of carbon nanomembranes (CNMs) with a thickness of 1

• nanoparticle assemblies at the fluid interfaces [7][8]. Freestanding nanomembranes with thicknesses from 20 to 70 nm were achieved by these approaches. Eck et al. reported the fabrication of carbon nanomembranes (CNMs) with a thickness of 1 nm by electron-induced cross-linking of aromatic self-assembled